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I-V Karakteriserings System

Denne brugervenlige Keithley model 4200 Halvleder Karakteriserings System udfører laboratorie klasse DC og puls-enheds karakterisering, real-tids plotting, og analyse med høj præcision og sub-femtoampere opløsning. 4200 tilbyder de mest avancerede funktioner til rådighed i et fuldt integreret karakteriserings system, herunder en komplet, integreret PC med Windows-operativsystem. Yderligere funktioner kan være stres-måle kapaciteter egnet til en bred vifte af pålidelighedstests.

- Intuitive, point-and-click Windows®-based environment
- Unique Remote PreAmps extend the resolution of SMUs to 0.1fA
- C-V instrument makes C-V measurements as easy as DC I-V
- Pulse and pulse I-V capabilities for advanced semiconductor testing
- Scope card provides integrated scope and pulse measure functionality
- Self-contained PC provides fast test setup, powerful data analysis, graphing and printing, and on-board mass storage of test results
- Unique browser-style Project Navigator organizes tests by device type, allows access to multiple tests, and provides test sequencing and looping control
- Built-in stress/measure, looping, and data analysis for point-and-click reliability testing, including five JEDEC compliant sample tests
- Integrated support for a variety of LCR meters, Keithley switch matrix configurations, and both Keithley Series 3400 and Agilent 81110 pulse generators
- Includes software drivers for leading analytical probers